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Showing 1 to 10 of 39 products

SPC-SQ LTU WIN

Product Number : 9430 024 53921

Statistical Process Control (SPC) is used to monitor the stability of a process. SPC continuously checks the measurements results obtained with SuperQ and alerts the operator to possible problems. This continuous monitoring of the results not only spots individual results that are outside the limits, but can also recognize long term trends in the measured results that are unlikely to be detected by the operator.

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Compatible with: XRF Range | Zetium | Axios Fast | Axios (mAX, 1kW)

ENH.DATA SEC. LTU WIN

Product Number : 9430 024 59921

Enhanced data security module for SuperQ designed to meet the stringent requirements for data security required by the FDA part 11 compliance.

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Compatible with: Zetium | Axios (mAX, 1kW)

OIL-TRACE SW LTU WIN

Product Number : 9430 024 66921

Oil-Trace is a complete solution for the analysis of oils and petrochemicals, performing elemental analysis independent from the sam ple type and sample size (weight or volume) or density. Using a single calibration fuel - biofuel mixtures, together with new and used lubricating oils can be analyzed, benefiting laboratories that have to create and maintain multiple calibrations. Oil-Trace is based on the 3rd generation of PANalytical’s powerful FP algorithm, which enables the characterization of oxygen- hydrocarbon matrices and can correct for the differences in density between wide varieties of samples.

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Compatible with: Zetium | Axios Fast | Axios (mAX, 1kW)

HIGHSCORE UPG WIN

Product Number : 9430 032 09961

Upgrade to the next major number version of the HighScore software (i.e. 3.x to 4.x). Performs data treatments and XRD phase identification on various systems. Data input and output is by files (all PANalytical and many competitor formats). This product requires an ICDD PDF-2 or PDF-4 database for phase identification. Includes the following features: ·    Search-match algorithm uses peak and profile data ·    Auto-residue scoring ·    Advanced reporting functions ·    Graphics for examining, displaying, and editing diffractograms ·    Supports any number of user-defined reference databases ·    Includes batch feature for auto function of a sequence ·    Automation ready - can be launched from a command prompt ·    Similarity analysis of scans (cluster analysis up to 50 scans) ·    Referenced Intensity Ratio (RIR) for estimation of quantities of all identified phases ·    Percent crystallinity ·    Very fast profile fitting ·    Line profile analysis, microstructure analysis by profile fits ·    PLS partial least squares to determine/quantify one property directly from raw data Windows XP Professional (32 bit) and Windows 7-8 Professional (32 bit and 64 bit) compliant

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Compatible with: Empyrean | X'Pert 3, Powder, PRO MPD | CubiX 3, PRO | Aeris

XPERT INDUSTRY UPG WIN

Product Number : 9430 032 31961

Upgrade to the latest number version of X'Pert Industry software. Software program for quantitative analysis. X'Pert Industry is based on an open analysis programming architecture which allows user definable calculations incorporating peak area, peak height, FWHM, and 2-theta position, and for CubiX-Pro Potflux systems, calcium intensity from the Ca XRF channel. The program supports up to third degree polynomial functions in calibrating for automated, quantitative phase analysis. Other features include automatic data transmission, customizable reports, SPC charting capability, sample changer and diffractometer graphical status displays, security with 10 levels of user specified program access, and a friendly user interface with customizable shortcut toolbar. X'Pert Industry is the ideal choice for quantitative analysis with diffraction systems, including sample changers and automation support. Includes an automation interface that allows full control of the diffractometer by a host computer without the need to specially adapt the standard X’Pert Industry application software. It allows the host computer to fully control the samples within the instrument, exchange status information and download as well as upload sample information. Includes Universal Automation Interface software module.

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Compatible with: X'Pert 3, Powder, PRO MPD | CubiX 3, PRO

DATACOLLECTOR UPG

Product Number : 9430 032 40961

Upgrade to the latest version of X'Pert Data Collector– Data Collector controls all PANalytical hardware connected to the X’Pert diffractometer system and contains graphics features for examining, displaying and editing diffractograms. Any scan in reciprocal space can be performed. Users can be assigned with various access levels, defining what is permitted and what is not. Data Collector supports the user defining their diffraction system and organizing their daily work. Provisions have been made for direct diffractometer control, manual scans, programmed measurements, checking and modifying the instrument status, General Batch Settings, optimization of phi and psi scan modes and addition of repetition scan ('wobbling') for improved particle statistics. The program utilizes the XRDML file format so that data is written as individual files anywhere on your computer or network. It features Z-scan capability to automate sample positioning and has easy sample changer setup features. User management and user security level access are included. Also included are X’Pert Automatic Processing Program for batch scripting of data collection, analysis and reporting functions for automatic sample analysis and X’Pert Explorer Add-Ons for managing, organizing, viewing, reporting and converting the XRDML data files. Older file formats may also be used for viewing and reporting. Extra functionality is made available in the Windows Explorer such as: extra pop-up menu items, dedicated information pop-up fields and dedicated thumbnail viewing of XRDML data files. Version 2.2 (and higher) requires a CPU2000 to be installed on the diffraction system.

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Compatible with: Empyrean | X'Pert 3, Powder, PRO MPD

BENCHTOP FINGERPRINT LTU

Product Number : 9430 040 58921

The FingerPrint optional module of the Epsilon 3 software package is an advanced and easy-to-use sample identification feature. Without the need for elemental concentrations a user simply measures reference samples and creates a library/database within an application. The advanced Chi2 analysis uses all sample spectra features including portions not normally considered, such as peak-shape and background profiles. No interpretation or sample knowledge is required. After a routine measurement FingerPrint automatically identifies a sample matching it to a reference sample/standard in the user library.

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Compatible with: Epsilon 4 | Epsilon 1 | Epsilon 3 (X, XL, XLE)

BENCHTOP EDS LTU

Product Number : 9430 040 59921

This Enhanced Data Security option in the Epsilon 3 software allows the user to handle electronic data according to FDA cfr 21 part 11. The use of electronic records and electronic signatures are governed according to the FDA regulations and has implications for the pharmaceutical and related industries and for their suppliers. The regulations relate to processes in the pharmaceutical industry, but whereas initially only manufacturing processes were involved, the requirements now extend to development and even research processes.

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Compatible with: Epsilon 4 | Epsilon 1 | Epsilon 3 (X, XL, XLE)

Stratos Epsilon LTU

Product Number : 9430 042 55921

Stratos E3 is a software option for spectrometers running under Epsilon 3 software version 1.1. Stratos enables the analysis of the composition and thickness of thin films and multilayers that are present in materials. The software can be calibrated with bulk samples and there is no need for in-type multilayer standards. When used in combination with Omnian, out of the box multilayer materials can be analysed using Stratos. The Omnian calibration can be augmented with additional bulk or thin film standards to improve the layer analysis results obtained by Stratos.

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Compatible with: Epsilon 4 | Epsilon 1 | Epsilon 3 (X, XL, XLE)

STRATOS SQ LTU MULTILAYER ANALYSIS

Product Number : 9430 045 55921

Stratos SQ is a software option for Axios range spectrometers operating under SuperQ 5. Stratos enables the analysis of the composition and thickness of thin films and multilayers that are present in materials. The software can be calibrated with bulk samples and there is no need for in-type multilayer standards. When used in combination with Omnian, out of the box multilayer materials can be analysed using Stratos. The Omnian calibration can be augmented with additional bulk or thin film standards to improve the layer analysis results obtained by Stratos.

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Compatible with: Zetium | Axios Fast | Axios (mAX, 1kW)